02186nam a2200241   450000500170000000800410001703500150005810000200007324500300009326000520012330000140017549000220018950001640021150200580037552011950043365000100162870000390163870000440167770000470172171000570176881000540182585600650187920260818223317.0011297         th                  eng    a.b114912671 aHsu, Rong-chung10aStudy on wave overtopping  aBangkok :bAsian Institute of Technology,c1971  a88 leaves1 aThesis ;vno. 360  aA thesis submitted in partial fulfillment of the requirements for the degree of Master of Engineering of the Asian Institute of Technology,  Bangkok, Thailand.  aThesis (M.Eng.) - Asian Institute of Technology, 1971  aThe problem "how to estimate the wave run-up and overtopping" has been important in design work of protective structures for as long as they are built. Although it has been considered as a complicated phenomenon, wave overtopping has been generally recognized as a combined  effect mainly caused by wave and structure characteristics.  The·· most previous investigations on this topic were rather confined on experimental data and dimensional analysis. Here, a detenninistic way in analytical approach with the modified broad-crested weir formula is employed after KIKKAWA and SHI-IGAI (1968). In this study, the governing equations for the sinusoidal and linear wave profiles are shown  respectively as follows:   With the analysis on system concept, the computed values of the characteristic parameter k have a quite consistent range throughout the experimental data in both author's tests at AIT and those of SAVILLE's  experiments. Therefore the relationship between k and Ho /Lo or k versus e is expected to have the advantage in fairly estimating the each time wave overtopping. Some useful figures prepared from theoretical computations are also provided herein for practical uses.10aWaves1 aShi-igai, Hiroyoshi, eChairperson0 aSubin Pinkayan, eExamination Committee0 aNiwat Daranandana, eExamination Committee2 a Asian Institute  of Technology, eScholarship Donor2 aAsian Institute of Technology.tThesis ;vno. 360  3Full-Textuhttp://203.159.5.9/ait-thesis/detail.php?q=B24447