02008nas a2200289 a 450000500170000000800410001703500150005810000180007324500840009126000570017530000220023250001240025450200590037852008680043765000320130565000190133765000300135670000330138670000480141970000460146771000590151385600650157290700250163790200110166299800280167399900170170120260818170709.0230830s2013    th a   |||    000   eng d  a.b124115891 aKarim, Farzia10aOptical fiber based sensor for in-situ monitoring of anodic alumina film growth  aPathum Thani :bAsian Institute of Technology,c2013  a82 leaves :bill.  aA thesis submitted in partial fulfillment of the requirements for the degree of Master of Engineering in Nanotechnology  aThesis (M. Eng.) - Asian Institute of Technology, 2013  aThis work presents a scheme for in-situ monitoring of anodic alumina film growth. A fiber optic sensor based on Fabry-Pérot interferometric technique with the combination of DC electrochemical anodization method has been established for the first time to monitor the in-situ growth of anodized aluminum oxide (AAO) film and measure the thickness of AAO. The anodization of aluminum sample was performed in different (2%, 4%, 5%, 6%, 8% and 10%) sulfuric acid (H2SO4) solutions by DC electrochemical methods at room temperature. The estimated thickness in situ was verified by SEM characterization and electrochemistry measurements. This study shows that, the measurement of thickness of anodic alumina film in-situ is feasible as it closely matched the thickness determined by scanning electron microscopy and other electrochemistry characterization techniques. 0aFabry-Perot interferometers 0aOptical fibers 0aAnodic Oxidation Aluminum1 aDutta, Joydeep,eChairperson1 aMohammed, Waleed S.,eExamination committee1 aHornyak, Gabor L.,eExamination committee2 aMinistry of Foreign Affairs, NorwayeScholarship Donor  3Full-Textuhttp://203.159.5.9/ait-thesis/detail.php?q=B05521  a.b12411589bmnaitcm  a240419  b0c230830dmea  fmg0  c83630d83630