000 03090nas a2200397 4500
005 20260817171233.0
008 301098s1983 th r 000| 0eng d
035 _a.b10109882
099 9 _aAIT Thesis no. EV-83-23
100 1 _aShin, Hyun Kook
245 1 0 _aBehaviour of coliform group in oxidation ponds
260 _aBangkok :
_bAsian Institute of Technology,
_c1983
300 _a77 leaves :
_bill.
490 1 _aThesis ;
_vno. EV-83-23
500 _aA thesis submitted in partial fulfillment of the requirements for the degree of Master of Science
502 _aThesis (M.Sc.) - Asian Institute of Technology, 1983
520 _aThree different types of coliform bacteria, E. coli., C. freundii and Kebsiella sp. were the major coliform group found in ArT oxidation ponds. These coliform bacteria were isolated from a sewage sample of the oxidation ponds, and the behaviour of each coliform bacteria was investigated. E. coli was the major coliform group in the influent of the oxidation ponds, while Klebsiella sp. was the most abundant group in the effluent of the oxidation ponds. More than 99.9% of C. freundii and about 99.9% of E. coli were removed, but 99.7% of Klebsiella sp.was eliminated in the oxi- dation ponds. And also, most of the coliform bacteria were eliminated in facultative pond, around 99.5% of total coliform bacteria. Based on the results of laboratory test, pH, temperature, light inten- sity and coliphage were the major factors affecting.the die-off process of coliform bacteria. Among species, Klebsiella sp. was the most resistant bacteria to the several environmental conditions. E. coli and C. freundii were more susceptible. Coliphage was also a significant parameter affecting the die-off process of coliform bacteria. An increased destruction of coliform bacteria was obtained especially in such conditions as high temperature, a little acidic pH range and high dosage of coliphage.
650 1 0 _aWater quality management
_xNepal
_xPhewa Lake
700 1 _aOmura, Tatsuo,
_eChairperson
700 0 _aChongrak Polprasert,
_eExamination Committee
700 1 _aVigneswaran, S.,
_eExamination Committee
710 2 _aCDG, Federal Republic of Germany,
_eScholarship Donor
810 2 _aAsian Institute of Technology.
_tThesis ;
_vno. EV-83-23
907 _a.b10109882
_bmnait
_cx
902 _a231005
998 _b2
_c951012
_dm
_ea
_fx
_g0
945 _lmnait
945 _lmnait
945 _lmnarc
942 _c20
942 _c40
909 _aBarcode : 30050003041901
_bCREATED : 1994-05-16
_cRECORD # : i10122345
_dLPATRON : 1015250
_eLCHKIN : 2005-01-23
_f# RENEWALS : 0
_g# OVERDUE : 0
_hIUSE3 : 0
_iTOT CHKOUT : 5
_jTOT RENEW : 2
909 _aBarcode : 30050120224794
_bCREATED : 2016-04-05
_cRECORD # : i12969965
_dLPATRON : 0
_eLCHKIN : -
_f# RENEWALS : 0
_g# OVERDUE : 0
_hIUSE3 : 0
_iTOT CHKOUT : 0
_jTOT RENEW : 0
909 _aBarcode : 30050121074735
_bCREATED : 2023-03-21
_cRECORD # : i13439509
_dLPATRON : 0
_eLCHKIN : -
_f# RENEWALS : 0
_g# OVERDUE : 0
_hIUSE3 : 0
_iTOT CHKOUT : 0
_jTOT RENEW : 0
999 _c11447
_d11447